EBIG Best Practices SIG 'The Paradox of Excellence' October 11, 2006

Best Practices SIG "The Paradox of Excellence"

As a technology leader, do you ever feel, as time goes on, like you are doing a better and better job, but your managers and colleagues seem to appreciate (and even acknowledge) it less and less?

Yet when something does go wrong - and it always will - all they can see is that!
You are not alone. This evening's talk will focus on helping you overcome "The Paradox of Excellence" and become more valued. Dave Mosby, co-author of "The Paradox of Excellence", will walk with you on a journey to discover how this Paradox may be playing out in your work and your life, what the symptoms are, what causes it, and what you can do about it to make your life better.

As a long time information professional himself, Dave has a special affinity for the challenges that you face and how you can overcome (or better yet avoid) this Paradox!

Read what people had to say about his book:

"...In my thirty-four years in business and eight as a college president, I have often seen and experienced the paradox of excellence phenomenon. This is a must-read for all in today's business and service environment."
--Bill Galvin, retired vice chairman, Xerox Corporation, and retired president, Babson College

"A fresh idea made very accessible - definitely worth reading!"
--Ron Okamoto, vice president, Worldwide Developer Relations, Apple Computer

"Ostensibly a business book essential to managers; but under the covers it's filled with insight for everyone in the enterprise..."
--Sam M. Sawires, CEO, Salveo, Inc.

"The Paradox of Excellence is a quick read and an excellent investment of your time...."
-Jerry McElhatton, president, Global Technology & Operations, MasterCard International

"I was so impressed with this book. I'm going to order an advanced copy for myself and members of my management team."
-Joan Waltman, president, Wireless Business Solutions, Qualcomm, Inc.
Free for members, $10 pre-registration, $15 at the door.

Official Website: http://www.ebig.org/sig/sig.aspx?SIGid=38&EventID=799&old=&eventdesc=full